Digital Library
Search: "[ author: R. Young Chul Kim ]" (6)
A Study on Modeling Heterogeneous Embedded S/W Components based on Model Driven Architecture with Extended xUML
Woo Yeol Kim , R. Young Chul Kim The KIPS Transactions:PartD,
Vol. 14, No. 1, pp. 83-88,
Feb.
2007
10.3745/KIPSTD.2007.14.1.83
10.3745/KIPSTD.2007.14.1.83
Detecting Common Weakness Enumeration(CWE) Based on the Transfer Learning of CodeBERT Model
Chansol Park, So Young Moon, R. Young Chul Kim KIPS Transactions on Software and Data Engineering,
Vol. 12, No. 10, pp. 431-436,
Oct.
2023
https://doi.org/10.3745/KTSDE.2023.12.10.431
Keywords: software engineering, Code Visualization, Code Complexity, Code Weakness, Artificial intelligence
https://doi.org/10.3745/KTSDE.2023.12.10.431
Keywords: software engineering, Code Visualization, Code Complexity, Code Weakness, Artificial intelligence
Metamodeling Construction for Generating Test Case via Decision Table Based on Korean Requirement Specifications
Woo Sung Jang, So Young Moon, R. Young Chul Kim KIPS Transactions on Software and Data Engineering,
Vol. 12, No. 9, pp. 381-386,
Sep.
2023
https://doi.org/10.3745/KTSDE.2023.12.9.381
Keywords: Meta Modeling, Korean Requirement Analysis, Test Case Automatic Generation, Cause-Effect Graph, Decision Table, C3Tree(Conditional and Conjunction Clause Tree)
https://doi.org/10.3745/KTSDE.2023.12.9.381
Keywords: Meta Modeling, Korean Requirement Analysis, Test Case Automatic Generation, Cause-Effect Graph, Decision Table, C3Tree(Conditional and Conjunction Clause Tree)
Building a Code Visualization Process to Extract Bad Smell Codes
Jihoon Park, Bo Kyung Park, Ki Du Kim, R. Young Chul Kim KIPS Transactions on Software and Data Engineering,
Vol. 8, No. 12, pp. 465-472,
Dec.
2019
https://doi.org/10.3745/KTSDE.2019.8.12.465
Keywords: Refactoring, Bad Smell, Visualization, process, JavaParser
https://doi.org/10.3745/KTSDE.2019.8.12.465
Keywords: Refactoring, Bad Smell, Visualization, process, JavaParser
The Assessment Guideline of the Simplified Test Maturity Model (TMM) for An Assessor
Woo Sung Jang, Ki Du Kim, Hyun Seung Son, Bo Kyung Park, R. Young Chul Kim KIPS Transactions on Software and Data Engineering,
Vol. 6, No. 8, pp. 379-384,
Aug.
2017
10.3745/KTSDE.2017.6.8.379
Keywords: Test Maturity Model (TMM), Test Assessment Guide, The Simplified Test Maturity Model
10.3745/KTSDE.2017.6.8.379
Keywords: Test Maturity Model (TMM), Test Assessment Guide, The Simplified Test Maturity Model
Plug-in Diverse Parsers Within Code Visualization System with Redefining the Coupling and Cohesion in the Object-Oriented Paradigm
Lee Jin Hyub, Park Ji Hun, Byun Eun Young, Son Hyun Seung, Seo Chae Yun, R. Young Chul Kim KIPS Transactions on Software and Data Engineering,
Vol. 6, No. 5, pp. 229-234,
May.
2017
10.3745/KTSDE.2017.6.5.229
Keywords: Complexity, Coupling, Cohesion, Plug-in
10.3745/KTSDE.2017.6.5.229
Keywords: Complexity, Coupling, Cohesion, Plug-in
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All publications of KTSDE is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTSDE is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
